Electron Microscope Facility

• Electron source: LaB6
• High-Resolution Pole Piece
• Line resolution: 0.14 nm
• Point resolution: 0.23 nm
• Magnification: 50x to 15,00,000x
• Accelerating Voltage: 80 kV – 200 kV
• Camera: Bottom Mounted Olympus Tengra 5.3 MP CCD Camera system
• Modes: TEM, EDS, NBD and CBD › Tilt range: X/Y : ±35 / ±30 degree

• Analysis of dry thin samples
• Micro structure analysis
• Structural Studies
• Chemical analysis

Transmission Electron Microscope (TEM) allows the researcher to obtain images of thin slices or nano particles of a variety of samples with resolution down to few nm. Lattice images and the defects associated with the samples could be analyzed along with crystal structures via electron diffraction analysis

• Resolution: HV mode – 3nm (30 kV) – 15 nm (1.0 kV)
• Resolution: LV mode – 4nm (30 kV BED)
• Magnification: 5x to 3,00,000x
• Accelerating voltage: 0.3-30 kV
• Inbuilt Detectors: SE & BSE
• Multiple ports for analytical attachments such as EDAX
• Specimen stage 5-axis motor stage X: 125mm Y:100mm Z:5-80mm T: 10-90° R: 360°

• High resolution imaging and high spatial-resolution analysis
• High throughout microanalysis using touch panel operation and the high speed stage
• Accommodates various sizes and types of specimens for extended observation and analysis

It is a tool to visualize the surface of solid samples with a resolution that can approach a few nm. Energy dispersive X-ray analysis could be used to analyze the chemical composition of a sample ~1μm region. Crystallographic orientation and structure could be examined using electron backscatter diffraction analysis. Microstructural features of a variety of materials that include metals, ceramics, biological, organic, etc. can be obtained.